정보
- ISBN : 9780123705976
- 출판사 : Morgan Kaufmann Publishers
- 출판일 : 20060721
- 저자 : Wang, Laung-terng (EDT)/ Cheng, Kwang-Ting (EDT)/ Chang, Yao-Wen (EDT)
요약
● This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, pra…
THIS BOOK IS A COMPREHENSIVE GUIDE TO NEW DFT METHODS THAT WILL SHOW THE READERS HOW TO DESIGN A TESTABLE AND QUALITY PRODUCT, DRIVE DOWN TEST COST, IMPROVE PRODUCT QUALITY AND YIELD, AND SPEED UP TIME-TO-MARKET AND TIME-TO-VOLUME. MOST UP-TO-DATE COVERAGE OF DESIGN FOR…
VLSI Test Principles and Architectures: Design for Testability (Hardcover)